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Search for "AM second eigenmode" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.
Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices
Beilstein J. Nanotechnol. 2018, 9, 1809–1819, doi:10.3762/bjnano.9.172
- mode; AM off resonance; AM second eigenmode; cross section; crosstalk; field effect transistor; FM-KPFM; frequency modulation heterodyne; frequency modulation sideband; quantitative Kelvin probe force microscopy; solar cells; Introduction In this study, we compare the most commonly used amplitude
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